00310 Ad65eb5323f68600e39f63d1a31de2f
16
Optimizing Defect Levels and Losses from Gage Errors
Daniel R. McCarville Motorola Inc.
Phoenix, Arizona
Douglas C. Montgomery Arizona State University Tempe, Arizona
Abstract
In many manufacturing settings, a senes of gages is used to screen product before it is shipped to the customer. The semiconductor industiy is a typical example of an industry where this type of serial inspection is used. A common problem is determining the target for each gage so that gage losses (good units classified as defective by the system of gages) and defect levels (defective units passed by the system of gages and sent to the customer) are at
313
Wyszukiwarka
Podobne podstrony:
00312 ?50bbf6d416fbf0edb061aff9ba2fbc 315 Optimizing Defect Levels and Losses from Gage Errors fina
00314 ?f49248905805fa4cf0d5be042fd4c1 317 Optimizing Defect Levels and Losses from Gage Errors Figu
00316 ?09c0d2f3a2243d1d46b1f997b3d3cf 319 Optimizing Defect Levels and Losses from Gage Errors Figu
00318 Fc61831291a35229ea5e67ab507c8cf 321 Optimizing Defect Levels and Losses from Gage Errors Guar
00320 ?5cd1011755558fd005661a9b3cd8ed 323 Optimizing Defect Levels and Losses from Gage Errors Defe
00322 ?b73d4dcbb3956a7a53bceacac34fb9 Optimizing Defect Levels and Losses from Gage Errors 325 Figu
00324 ?4f0003b2ed2810dd76bb30abe464e6 327 Optimizing Defect Levels and Losses from Gage Errors goal
00326 A9b69718dd18cd338e0f0700b7c79c2 329 Optimizing Defect Levels and Losses from Gage Errors + f(
00328 ?80eb3e1366a39705d7b77d62f12780 331 Optimizing Defect Levels and Losses from Gage Errors ao P
00330 r8ad54f747f0f287dd69fb4ed228e35 333 Optimizing Defect Levels and Losses from Gage Errors The
00332 ?133d2464eb28601d2d991683b45647 335 Optimizing Defect Levels and Losses from Gage Errors on t
00334 ?b2793f238bc36b5f1c29c11f214359 Optimizing Defect Levels and Losses from Gage Errors 337 Resp
00336 ?e7e8dcfe0a23e46d4a41cf7d1feb53 Optimizing Defect Levels and Losses from Gage Errors 339 zao
00338 ?79650d4af41fcdcb3a1354afe938a8 Optimizing Defect Levels and Losses from Gage Errors 341 di =
00340 Vbfa1728c6ca8c65c355df31b8a4ed5 343 Optimizing Defect Levels and Losses from Gage Errors Grub
nIN A PR IL OF 1906,THE GROUND IN SAN FRANCISCO SHOOK BUILDINGS AND LIVES FROM THEIR FOUNDATION
więcej podobnych podstron