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Sensitivity to Grain Size

ni am-nrlil cl::|-i ;i wwHttlyi i- • ?K


Peak profiles show tremendous

sensithdty to size of I diffractmg ciystał J

_    _ _ _ _ _ _ _, _c

IStrongest variation of | Ipeak width is I observed for grain I sizes below 1 Onm

This can be used for determination of size at aceuracy as high as a single atomie piane


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